Tesi etd-05292017-133949 |
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Tipo di tesi
Tesi di laurea magistrale
Autore
DI PIRRO, MASSIMILIANO
URN
etd-05292017-133949
Titolo
Fault injection activity as part of Functional Safety lifecycle to validate MCU safety level in compliance whit ISO26262
Dipartimento
INGEGNERIA DELL'INFORMAZIONE
Corso di studi
INGEGNERIA ELETTRONICA
Relatori
relatore Prof. Fanucci, Luca
Parole chiave
- automotive
- fault injection
- functional safety
- ISO26262
Data inizio appello
23/06/2017
Consultabilità
Non consultabile
Data di rilascio
23/06/2087
Riassunto
The following thesis has been written during the apprenticeship in "Renesas Electronics Europe" company.
After an excursus on the automobile history and the ISO26262, the functional safety lifecycle is described and how it is applied on the MCU "P1x" using the Renesas original methodology. A particular focus is dedicated to the fault injection, a powerful instrument to verify the impact of faults inside the electronics system. An example of this application is then shown on the ECM (Error Control Module), the handler of all errors coming from the Safety Mechanisms. At the end results it is shown that fault injection guarantee the values required by the safety level.
After an excursus on the automobile history and the ISO26262, the functional safety lifecycle is described and how it is applied on the MCU "P1x" using the Renesas original methodology. A particular focus is dedicated to the fault injection, a powerful instrument to verify the impact of faults inside the electronics system. An example of this application is then shown on the ECM (Error Control Module), the handler of all errors coming from the Safety Mechanisms. At the end results it is shown that fault injection guarantee the values required by the safety level.
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